CIRCULAR WAVE-REVERSING INTERFEROMETER Russian patent published in 1997 - IPC

Abstract SU 1383969 A1

FIELD: measurement technology; checking spherical and aspherical (slightly other than spherical) surfaces of optical parts for correct shape. SUBSTANCE: double-frequency laser source 1 and collimator lens 2 produce collimator beam. Prism-cube 3 with polarized light-splitting layer bifurcates beam into operating and reference ones. Both arrive at viewing system with minimum loss due to reverse circular trace of waves , and photodetector 14 of this system, whose drive is connected to bidirectional bus 19, scans the field by interference in plane joined through projection system (positive elements 7, 9 and negative one 10) to surface 20 under check. Picked off output of photodetector 14 is signal whose phase varies with respect to that of reference signal picked off photodetector 15. Light-sensitive surface of photodetector 15 is joined with that of photodetector 14. Operating and reference signals are compared in phase-difference metering unit 16. Controller 17 functions to process data and to control operation of scanning photodetector 14 and phase-difference metering unit 16. This controller also computes topography of surface under check on display 18 by phase difference. Data exchange among unit 16, scanning photodetector 14, controller 17, and display is made over bus 19. EFFECT: improved accuracy and capacity of check due to automatic control based on optical heterodyning. 1 dwg

Similar patents SU1383969A1

Title Year Author Number
INTERFEROMETER WITH REVERSE-LOOP BEAM PATH FOR CHECKING FORM OF CONCAVE SPHERICAL AND ASPHERICAL SURFACES OF OPTICAL PARTS 1979
  • Gubel' N.N.
  • Dukhopel I.I.
  • Efimov V.K.
  • Fedina L.G.
SU786471A1
LASER SCANNING MICROSCOPE 2005
  • Valejko Mikhail Valentinovich
  • Shatrov Jakov Timofeevich
  • Chalkin Stanislav Filippovich
RU2285279C1
INTERFEROMETER FOR MEASURING LINEAR DISPLACEMENTS OF OBJECTS 2020
  • Sigitov Evgenii Aleksandrovich
  • Bessonova Anna Ivanovna
  • Arav Konstantin Valerevich
RU2745341C1
INTERFEROMETER 2011
  • Gavrilov Dmitrij Sergeevich
  • Loboda Evgenij Anatol'Evich
  • Kakshin Aleksej Genrikhovich
RU2482447C2
DOUBLE-SIDED INTERFEROMETER FOR MEASUREMENT OF LENGTH GAUGE RODS 2014
  • Orlov Vjacheslav Vasil'Evich
RU2557681C1
OPHTHOELECTRONIC INTERFEROMETER FOR CHECKING OPTICAL PART SURFACE SHAPE 0
  • Araev Ivan Petrovich
  • Voronina Valentina Ivanovna
  • Gorshkov Vladimir Alekseevich
  • Lozbenev Evgenij Ivanovich
  • Pushechnikov Valentin Pavlovich
  • Kryakhtunov Vladimir Semenovich
  • Fomin Oleg Nikolaevich
  • Galiulin Ravil Masgutovich
  • Gorlov Sergej Nikolaevich
  • Zagulyaev Aleksej Viktorovich
  • Kuznetsov Yurij Alekseevich
  • Guzman Vladimir Efimovich
SU1062519A1
DISPLACEMENT MEASURING DEVICE 0
  • Mironov Aleksandr Vladimirovich
  • Privalov Vadim Evgenevich
  • Sinitsa Svetlana Aleksandrovna
SU1758433A1
INTERFEROMETER FOR MULTIPLE OPTICAL MEASUREMENTS 2016
  • Abdulkadyrov Magomed Abdurazakovich
  • Semenov Aleksandr Pavlovich
  • Patrikeev Vladimir Evgenevich
  • Puryaev Daniil Trofimovich
  • Druzhin Vladislav Vladimirovich
  • Lazareva Nataliya Leonidovna
RU2615717C1
DEVICE FOR MAKING RADIAL DIFFRACTION LATTICE 1989
  • Gordeev S.V.
  • Turukhano B.G.
  • Khristachev A.E.
RU1641105C
DIFFRACTION INTERFEROMETER 2003
  • Koronkevich V.P.
  • Lenkova G.A.
RU2240503C1

SU 1 383 969 A1

Authors

Seregin A.G.

Dukhopel I.I.

Dolik I.V.

Zhdanova L.A.

Efimov V.K.

El'Nitskaja L.S.

Konstantinovskaja N.V.

Tul'Eva T.N.

Sidorov V.I.

Fedina L.G.

Dates

1997-07-20Published

1986-06-24Filed