METHOD OF X-RAY MICROANALYSIS OF SUBSTANCE WITH ION EXCITATION Russian patent published in 1994 - IPC

FIELD: X-ray analyses. SUBSTANCE: method involves alternate irradiation of sample of analyzed substance and of exemplary sample containing two-component material including two chemical elements with substantially different atomic numbers, registration of characteristics of X-ray quanta of determined elements and of elements of exemplary sample with one detector and spectrometric path with formation of one multichannel spectrum. Collected numbers of pulses conditioned by characteristic emission of determined elements and elements of exemplary sample are measured and used to judge on content of determined chemical elements. In process of performance of analysis ratio of velocities of counting of characteristic emissions of elements of exemplary sample is measured and found value of this ratio is compared with its value at initially chosen energy of ions used in calibration. If compared values do not substantially-statically differed from each other then desired contents are calculated. In opposite case measurement is repeated. EFFECT: improved accuracy of analysis thanks to control over energy of ions.