METHOD FOR MEASURING THE AMOUNT OF PROCESS ADDITIVES AND RANDOM IMPURITIES IN HISTORICAL GLASSES BY THE X-RAY FLUORESCENCE WITH A SYNCHROTRON RADIATION SOURCE Russian patent published in 2023 - IPC G01N23/223 

FIELD: measurement.

SUBSTANCE: measurement of the amount of process additives and random impurities in historical glasses by X-ray fluorescence. Essence of the invention lies in the use of synchrotron radiation as an excitation source for the determination of technological additives and random impurities (Ti-Zn) in historical glasses, while to register the intensity ratios Kα line of the determined element to the intensity of the line of the internal standard, the excitation energy of the X-ray beam is set close to the absorption edge of the used excitation line for each element, determined by the binding energy of its K-shell.

EFFECT: enabling reliable determination of the amount of process additives and random impurities in historical glasses.

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