METHOD FOR X-RAY SPECTRAL DETERMINATION OF NANOPARTICLE SIZE IN SAMPLE Russian patent published in 2015 - IPC G01N23/201 B82B3/00 

Abstract RU 2548601 C1

FIELD: physics.

SUBSTANCE: method includes successive irradiation in transmission mode and in reflection mode of the analysed area of a sample with monochromatic X-ray beams with energy which corresponds to the minimum and maximum absorption thereof near the K absorption edges of X-ray radiation by atoms of elements which are part of the analysed area of the sample, recording low-angle scattering curves of X-rays in transmission mode at first and second mutually perpendicular positions of the sample and in reflection mode from the analysed area of the sample while rotating the sample in the detection plane and with a fixed monochromator crystal and determining the size of nanoparticles from the shape of low-angle scattering curves of X-rays.

EFFECT: enabling detection of nanosize formations within a material, including irregularly and randomly distributed nanoparticles in a sample.

11 dwg

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RU 2 548 601 C1

Authors

Boiko Mikhail Evgen'Evich

Sharkov Mikhail Dmitrievich

Boiko Anfrei Mikhailovich

Bobyl' Aleksandr Vasil'Evich

Terukov Evgeny Ivanovich

Dates

2015-04-20Published

2013-11-20Filed