FIELD: metrology. SUBSTANCE: specimen provided with rectifying contact is irradiated by fixed wavelength from long-wave region of specimen spectral sensitivity. Photocurrents and capacities of specimen are measured at two different reverse-bias voltages across specimen. Photocurrent through specimen is measured when specimen is exposed and not exposed to magnetic field whose flux density vector is parallel to specimen surface. Desired values of minority carrier Hall mobility, life time, and diffusion length are determined by calculation. EFFECT: improved accuracy and facilitated procedure of determining parameters of minority charge carriers in semiconductors. 1 dwg
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