FIELD: crystallography. SUBSTANCE: beam of linearly polarized coherent radiation is directed on to flat polished surface of crystal, crystal is rotated around axis perpendicular to its irradiated surface, intensity of second harmonic is registered and by its change angles of orientation of crystallographic axes are judged. EFFECT: enhanced accuracy of orientation of crystallographic axes.
| Title | Year | Author | Number |
|---|---|---|---|
| PROCESS OF MEASUREMENT AND TESTING OF PARAMETERS OF LAYERS OF MICROCIRCUITS | 1991 |
|
RU2006985C1 |
| METHOD FOR DETERMINING PARAMETER OF CUBIC MONOCRYSTAL OPTICAL ANISOTROPY RELATED TO SYMMETRY CLASS OF M3M, 43M, OR 432 | 2016 |
|
RU2629700C1 |
| PROCESS OF EXAMINATION OF CONDUCTIVE SURFACE | 1999 |
|
RU2164020C2 |
| METHOD FOR MEASURING PHASE SHIFT OF TRANSPARENT OPTICAL ANISOTROPIC SPECIMEN | 2000 |
|
RU2184365C2 |
| METHOD FOR REFLECTING LASER BEAMS MAINTAINING THE POLARISATION AND REFLECTOR BASED THEREON | 2021 |
|
RU2759577C1 |
| DEVICE FOR DETERMINING CRYSTALLOGRAPHIC DIRECTIONS OF MONOCRYSTALS | 0 |
|
SU1176457A1 |
| LASER TREATMENT UNIT | 2014 |
|
RU2673271C2 |
| METHOD FOR GENERATING NARROW-BAND TERAHERTZ RADIATION (EMBODIMENTS) | 2017 |
|
RU2655469C1 |
| DEVICE MEASURING LINEAR MOVEMENTS | 1989 |
|
SU1816082A1 |
| METHOD OF ORIENTATION OF MONOCRYSTAL TARGET | 0 |
|
SU976509A1 |
