FIELD: non-destructive inspection. SUBSTANCE: device has power supply source 1, signal generator 2, resistors 3...7, capacitors 8...13, diodes 14. 15, transistor 16 inductive sensor 17, choke 18, indicator 19, zero potential bus 20. The circuit of generator 2 provides effective use of amplification properties of transistor 16 at converting an amplitude of occurring oscillations into a constant signal to indicator 19 from the output of an amplitude detector composed of diodes 14, 15 and resistor 5. EFFECT: widened film thickness measurement range. 1 dwg
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