FIELD: measurement technology. SUBSTANCE: electromagnetic radiation flux excites surface electromagnetic wave in metal film located on substrate made of semiconductor material. In this case investigated medium is placed in zone of propagation of electromagnetic radiation and/or of surface electromagnetic wave. Signal registered in circuit between metal film and semiconductor layer characterizes corresponding parameter of investigated medium. EFFECT: improved authenticity of measurements. 14 cl, 8 dwg
Authors
Dates
1994-10-15—Published
1993-03-31—Filed