METHOD OF DETERMINING CRYSTALLOGRAPHIC AXIS OF DIAMONDS UPON THEIR WORKING Russian patent published in 1994 - IPC

FIELD: hard material working. SUBSTANCE: method comprises steps of bringing a diamond and a tool to mutual contact and imparting to them relative motion; measuring a parameter, characterizing their physical interaction; selecting as parameters wave process parameters, the process takes place in a zone of the diamond and the tool interaction; determining a dependance of values of the above mentioned parameters from an orientation angle of the diamond relative to a working surface of the tool in order to detect angle values, corresponding to maximum and minimum values of the wave process parameters; fixing according to the minimum value of such parameters a direction of a soft crystallographic axis and according to the maximum value - a direction of hard crystallographic axis. It is recommended to use as the above mentioned parameters the parameters of acoustic emission, electromagnetic irradiation or exoelectronic emission. EFFECT: enhanced accuracy of determination. 4 cl, 3 dwg