FIELD: physico-chemical analysis. SUBSTANCE: mix of oxides is melted, melt is superheated and cooled at a rate of 25 to 50 C/h; at the same time the temperature and electrical resistance are measured, temperature dependence are determined. The melt electrical resistance is measured in succession at frequencies within the range of 100 - 50 · 103 Hz, resonance frequency in the range of 500 - 25 · 103Hz is determined, after which the padding resistance of the electrode layer, reactive and the beginning of crystallization is judged by variation of temperature coefficient of resistive component. EFFECT: facilitated procedure. 1 tbl, 2 dwg
Title | Year | Author | Number |
---|---|---|---|
SHOCK-PROOF SCINTILLATION DETECTOR | 1992 |
|
RU2072532C1 |
METHOD OF DETERMINING THE BEGINNING OF CRYSTALLIZATION WHEN GROWING CRYSTALS FROM SOLUTION-MELT | 0 |
|
SU1589173A1 |
METHOD FOR PREPARING CRYSTALS OF CHALCOGENIDES OF AB-TYPE | 1991 |
|
RU2031983C1 |
DEVICE FOR CRYSTAL GROWING | 1991 |
|
RU2049829C1 |
METHOD FOR MONITORING AND CONTROL OF DIAMOND SYNTHESIZING PROCESS | 1989 |
|
RU2032617C1 |
PROCESS OF ASSEMBLY OF SCINTILLATION DETECTOR AND GEAR FOR ITS IMPLEMENTATION | 1991 |
|
RU2069871C1 |
STEPANOV'S METHOD OF SEEDING IN PROFILE CORUNDUM MONOCRYSTAL GROWING | 1987 |
|
RU1503355C |
METHOD OF GROWING PROFILED CRYSTALS | 1983 |
|
SU1131259A3 |
SCINTILLATION DETECTOR AND PROCESS OF ITS ASSEMBLY | 1990 |
|
RU2014634C1 |
DEVICE FOR MEASURING IR-RADIATION SCATTERING AND ABSORPTION FACTORS | 1990 |
|
RU2024826C1 |
Authors
Dates
1995-07-20—Published
1992-06-01—Filed