FIELD: electronic equipment. SUBSTANCE: method involves applying continuous layer of metalling paste with the thickness of 20-30 micron onto test high alumina content substrate; sintering at temperature of 1450-1650 C; regulating paste content; applying this paste (No1) onto additional test substrate to form conductor of predetermined width; sintering; controlling shrinkage ratio of conductor and substrate by measuring conductor length in the zone of local defect; comparing it with that of continuous layer of paste (No1) and conducting further regulation of paste content to provide decreasing of shrinkage coefficient for a value equal to difference between shrinkage coefficients of conductor and continuous layer of paste (No1); applying ready paste onto substrate and sintering. EFFECT: increased efficiency and high quality of boards.
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Authors
Dates
1995-09-10—Published
1990-02-05—Filed