METHOD INTENDED FOR DETERMINATION OF SURFACE RESISTANCE OF HIGH-CONDUCTANCE MATERIALS Russian patent published in 1997 - IPC

Abstract RU 2094783 C1

FIELD: measurement technology. SUBSTANCE: method makes it possible to measure sufficiently easily surface resistance (substantial part of complex surface impedance) of high-conductance specimens including super-conductance ones in microwave range and is universal as regards specimen form. In contrast to similar known methods, simplicity of the given method boils down only to measuring the standing-wave ratio in waveguide connected to measuring resonator by means of up-to-date panoramic measuring instrument. Preliminary calibration is performed with the aid of two standard specimens of the same geometrical form and dimensions as specimen under test, with known surface resistance. Standard specimens of copper and lead are suitable for analysis of materials of high-temperature super-conductance. There are no considerable restrictions as to form of analyzed specimens, but specimens of correct geometrical form are preferable due to simplicity of their manufacture. Minimum surface area of specimens in 3-cm range is about 5 sq.cm. At other frequencies it is directly proportional to wave length in vacant space. Principle feature of method is establishment of connection between standing-wave ratio and surface resistance irrespective of structure of field of measuring resonator operating oscillations and quality factor, if the latter is sufficiently high. Method gives clear definition of surface resistance subject to measurement. This method is most convenient for measuring the surface resistance of newly developed super-conductance materials in microwave band. EFFECT: higher measurement results. 1 dwg , 1 tbl

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RU 2 094 783 C1

Authors

Stoljarov O.I.

Tsimbal F.A.

Dates

1997-10-27Published

1992-07-21Filed