MICROWAVE DEVICE FOR NONDESTRUCTIVE MEASUREMENTS OF ELECTROPHYSICAL PARAMETERS OF INSULATING MATERIALS Russian patent published in 2002 - IPC

FIELD: microwave instrumentation engineering for nondestructive inspections of insulating materials. SUBSTANCE: device designed for nondestructive local measurement of dielectric constant (ε′) and dielectric power factor of insulating materials has coaxial resonator with measuring aperture at end and clamp; it also has round-section below-cutoff waveguide coaxial with measuring aperture, its radius being greater than that of measuring aperture by minimum three times and resonator end area greater than cross-sectional area of below-cutoff waveguide; flange is provided on external side of below-cutoff waveguide, at one of its edges, for mounting flexible ring; other edge of below-cutoff waveguide is enclosed by end wall; below-cutoff waveguide is placed in cylindrical bore of clamp and is coupled with the latter through flexible ring. EFFECT: enhanced measurement accuracy. 5 dwg