FIELD: semiconductor metal science; determining electrophysical properties of semiconductor materials. SUBSTANCE: for determining concentration of mobile carriers in semiconductor, specimen is evacuated, exoelectronic emission of current is determined as function of temperature during slow heating of specimen and its surface treatment with ultraviolet rays. Specimen is then slowly cooled down. Exoelectronic emission as function of temperature is determined again under same conditions and additional surface treatment with infra-red rays at known density of light flux. Two dependences are compared. Temperature at which exoelectronic emission currents coincide is determined and included, together with light flux density, in unknown parameter calculations. EFFECT: facilitated procedure. 3 dwg
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