DEVICE FOR MEASURING THE CHANGE IN GAS PERFECTION INDEX Russian patent published in 1997 - IPC

FIELD: measurement technology. SUBSTANCE: device has source of p-polarized monochromatic radiation, metal film applied on planar optical substrate, element of conversion of flat electromagnetic wave to surface one, photoreceiver, and measuring instrument. In addition, provision is made for element of conversion of surface electromagnetic wave to flat one positioned along track of surface electromagnetic waves. Metal film is made semitransparent, and substrate is manufactured of semiconductor with index of refraction below gas refraction index. Metal film thickness is determined by solution of transcendental equation given in description. EFFECT: higher accuracy of measurements.