METHOD AND DEVICE FOR DETECTION OF OPTICAL PARAMETERS OF CONDUCTING SAMPLES Russian patent published in 2000 - IPC

FIELD: instruments for optical and physical measurements, in particular, for production of metal-optical structures, metal-dielectric waveguides, metal mirrors and substrates. SUBSTANCE: method involves using radiation with non-zero p- and s-constituents of field for excitation of surface electromagnetic waves. This results in alteration of intensity of field constituents: it is decreased for p-constituent, and is kept constant for s-constituent. This leads to pronounced resonant response of dependence of polarization plane rotation angle to efficiency of excitation of surface electromagnetic waves. This results in possibility of more precise detection of beam incidence angle corresponding to maximal efficiency rate. EFFECT: increased precision for detection of parameters of sample. 2 cl, 2 dwg