METHOD OF GAMMA-STEREOSCOPY Russian patent published in 1997 - IPC

Abstract RU 2098799 C1

FIELD: examination and analysis of materials. SUBSTANCE: method makes it possible to obtain information on distribution of electronic density in object being analyzed in direction of quasi-linear beam of probing photons. To this end, first distribution of intensity of photons Compton-scattered along beam of probing photons is measured, and then integral Volterra-type equation is solved. This equation relates distribution of intensity of Compton-scattered photons to distribution of electronic density sought for. EFFECT: usage of three-dimensional defectoscopic information instead of two-dimensional one. 2 cl, 3 dwg

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RU 2 098 799 C1

Authors

Rad'Ko V.E.

Dates

1997-12-10—Published

1994-03-10—Filed