METHOD AND DEVICE FOR COMPTON-FLUORESCENT ELEMENTAL ANALYSIS Russian patent published in 2006 - IPC G01N23/20 G01N23/22 

Abstract RU 2284028 C2

FIELD: quantitative and qualitative elemental analysis.

SUBSTANCE: objects are subjects by probing gamma-quantum irradiation with E0 energy and energy distribution of gamma-quanta is measured, dissipated according to Compton-effect on bound electron in mode of time coincidence mode with X-ray photons from K-set. First the list of elements to be analyzed is chosen according to ascend of atom number Z1<Z2, <...<Zn and list of binding energy of K-electrons, corresponding to that one, E(Z1)<E(Z2)<...E(Zn) and sequent ranges of angles of dissipation Δφ1, Δφ2,... Δφn of probing quanta are measured, inside which angles the quanta dissipate after K-vacancy is excited from one additional K-set of list E(Z1)<E(Z2)<...E(Zn) into each range. Then detectors for registration of dissipated gamma-quanta are placed into any that range. Amplitude of signal from range is subject to amplification and normalization independently. Results of simultaneous adding of normalized amplitudes with amplitudes received from detector are stored, which amplitudes were received from detector that registers X-ray photons of different K-sets. Selectivity of simultaneous registration of X-ray photon and of photon, dissipated according to Compton-effect mechanism, allows identifying atom numbers of elements. Concentrations of elements to be found in tested object are determined from results of simultaneous summing.

EFFECT: non-destructing multi-elemental analysis under high radiation background.

2 cl, 4 dwg

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RU 2 284 028 C2

Authors

Rad'Ko Valerij Evgen'Evich

Dates

2006-09-20Published

2004-10-15Filed