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2 116 619

(13)

C1

(51)

IPC

(21) (22)

Application

5039319/28, 1992-04-24

(22)

Actual filing date

1992-04-24

(45)

Published

1998-07-27

(72)

Inventor

Bunzh Z.A.Vejde A.A.Tesnavs Eh.R.

(73)

Holder

Bunzh Lajmonis Andreevich

RADIOISOTOPE THICKNESS GAUGE Russian patent published in 1998 - IPC

Abstract RU 2116619 C1

FIELD: radioisotope device of nondestructive inspection. SUBSTANCE: simplification of calibration of radioisotope thickness gauge is achieved thanks to provision of gauge incorporating measurement converter, medium frequency meter, univibrator, indicator, multiplier, divider, multiplexer, first and second master units with second multiplexer and OR gate. EFFECT: simplified calibration of thickness gauge. 1 dwg

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RU 2 116 619 C1

Authors

Bunzh Z.A.

Vejde A.A.

Tesnavs Eh.R.

Dates

1998-07-27—Published

1992-04-24—Filed

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