RADIOISOTOPE THICKNESS GAUGE Russian patent published in 1998 - IPC

Abstract RU 2116620 C1

FIELD: measurement technology, nondestructive inspection. SUBSTANCE: invention is used in radioisotope device of nondestructive inspection and allows number of needed calibration constants to be diminished thanks to provision of thickness gauge incorporating measurement converter, meter of medium frequency of pulses, control unit, indicator, linearizer, adder, subtracter, first and second multiplexers, controlled master unit, first and second master units with multiplexer and register. EFFECT: diminished number of required calibration constants without increase of calibration error of thickness gauge. 3 cl, 4 dwg

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RU 2 116 620 C1

Authors

Bunzh Z.A.

Vejde A.A.

Tesnavs Eh.R.

Dates

1998-07-27Published

1992-04-24Filed