X-RAY FLUOROSCOPE Russian patent published in 1998 - IPC

FIELD: non-destructive flaw detection of materials and articles. SUBSTANCE: flaws are detected by peripheral vision which is more sensitive to object shifts when operator detects additional fixation light source which is located in field of vision so that angular distance between direction to flaw and to additional fixation light source is within range of 10-50 degrees. Aperture and optical filters are located before light source for alternation of its brightness, color and angular size. EFFECT: increased fidelity of detection of low-contrast flaws. 1 dwg