METHOD FOR FUNCTIONAL DESTRUCTION OF SEMICONDUCTOR RADIO ELECTRONIC EQUIPMENT AND DEVICE FOR ITS EMBODIMENT Russian patent published in 2000 - IPC

FIELD: warfare. SUBSTANCE: method involves exposition of object to heavy microwave flow in some bandwidth, detection of spectrum of reflected signals from object at even harmonic frequencies, measuring amplitude-frequency response of reflected signals, and using it for detection of working frequency which is most suitable for functional destruction of object. Then density of microwave flow is increased for this frequency. Then method involves repeated exposition of object to heavy microwave flow in some bandwidth, detection of spectrum of reflected signals from object at even harmonic frequencies, measuring amplitude-frequency response of reflected signals, which is compared to initial response. Analysis of difference between responses is used for judging functional destruction of object. Corresponding device has relativist microwave generator, transmitting antenna, resonance compressor of microwave pulses with tuning system of its resonant frequency and input connection, receiving antenna, which is connected to harmonic signal detector through band-pass filter. EFFECT: detection of emission frequency, which is most suitable for functional destruction of radio electronic circuit. 3 cl, 1 dwg