FIELD: quality control. SUBSTANCE: method includes formation of homogeneous coupling layer on flat surface of specimen made of surface-active material. Thickness of coupling layer is less than depth of permeability of field of surface electromagnetic waves by collimated monochromic p-polarized radiation of external source on coupling layer-specimen boundary into coupling layer material. Method includes recording of spatial distribution of reflected radiation intensity by photoreceiving device. In this case, specimen surface being examined is limited by airtight barrier the height of which exceeds coupling layer thickness. Homogeneous coupling layer is formed by applying the liquid layer on specimen surface. This done, specimen with liquid coupling layer formed on its surface is placed in liquid insoluble in coupling layer liquid the density of which is less than that of coupling layer liquid, and refractive exceeds actual part of effective refractive index of surface electromagnetic waves. EFFECT: higher results of examination. 2 dwg
Title | Year | Author | Number |
---|---|---|---|
METHOD DESIGNED TO EXAMINE SURFACE OF SEMITRANSPARENT SPECIMEN BY SURFACE ELECTROMAGNETIC WAVE MICROSCOPY | 1996 |
|
RU2097747C1 |
PROCESS EXAMINING SURFACE OF SOLID | 1998 |
|
RU2142621C1 |
METHOD DETERMINING PROFILE OF MENISCUS OF LIQUID | 1997 |
|
RU2108563C1 |
PROCESS OF EXAMINATION OF CONDUCTIVE SURFACE | 1999 |
|
RU2164020C2 |
PROCESS OF ELLIPSOMETRIC STUDY OF THIN FILMS ON FLAT SUBSTRATES | 1997 |
|
RU2133956C1 |
SURFACE ELECTROMAGNETIC WAVE SPECTROMETER | 1995 |
|
RU2091733C1 |
PROCESS DETERMINING CONCENTRATION OF IONS IN LIQUID | 1996 |
|
RU2101696C1 |
METHOD AND DEVICE FOR DETECTION OF OPTICAL PARAMETERS OF CONDUCTING SAMPLES | 1998 |
|
RU2148814C1 |
PROCESS OF SPECTROSCOPY OF TRANSITION LAYER OF CONDUCTING SURFACE | 2000 |
|
RU2170913C1 |
PROCESS DETERMINING OPTICAL ACTIVITY OF SUBSTANCE | 1998 |
|
RU2147741C1 |
Authors
Dates
1997-11-27—Published
1995-03-06—Filed