PROCESS MEASURING RADIATION CONDUCTANCE OF DIELECTRIC MATERIAL Russian patent published in 2000 - IPC

FIELD: study and analysis of materials, prediction of behavior of dielectric materials in radiation fields, description of dynamics of accumulation of radiation space charge. SUBSTANCE: process is based on measurement of current induced under effect of radiation of dielectric material. With this in mind dielectric material is positioned between two volumes of conducting liquids which density and effective atomic charges are equal or close in value to analogous parameters of examined material. EFFECT: simplified measurement process, possibility of prevention of influence of boundary effects without usage of additional compensation methods. 2 dwg