FIELD: computer engineering. SUBSTANCE: process for refreshing locations of memory device using complementary metal-oxide- semiconductor structure includes sequential access to memory blocks that do not use common capacitors of ripple filter in the course of refreshing cycles. In the process, refreshing noise at drain voltage of memory device are reduced. EFFECT: increased time taken to recover supply voltage to its original level. 7 cl, 6 dwg
Authors
Dates
2001-02-10—Published
1996-06-27—Filed