FIELD: measurement technology. SUBSTANCE: invention is related to equipment measuring thermal parameters of components of radio electronic hardware, specifically, semiconductor diodes, is designed to test quality of electronic articles and to evaluate their temperature reserves. Proposed process measuring thermal resistance of two-terminal networks with known positive temperature coefficient of current consists in supply of pulse of heating direct current and in measurement of change of temperature-sensitive parameter. Reference two-terminal network with known resistance is connected in parallel to tested two-terminal network before supply of pulse of heating current and change of value of current flowing through reference two-terminal network before and after heating is measured. Value of this change determines value of thermal resistance of tested two-terminal network. To ensure equality of instantaneous powers scattered by tested and reference two-terminal networks at initial time moment before their heating adjustment resistors are connected in series with two-terminal networks, train of short pulses of current having large relative pulse duration and amplitude equal to amplitude of pulse of heating current is supplied. Resistance of adjustment resistors is set at such value that equality of instantaneous powers scattered by tested and reference two-terminal networks is realized, then pulse of heating direct current is supplied and change of temperature-sensitive parameter is measured. EFFECT: increased accuracy of measurement of thermal resistance of two-terminal networks, reduced number of hardware components. 1 cl, 3 dwg
