TECHNIQUE MEASURING THERMAL RESISTANCE OF TWO-TERMINAL NETWORKS Russian patent published in 2003 - IPC

Abstract RU 2206900 C1

FIELD: measurement of thermal parameters of electric and radio elements. SUBSTANCE: technique measuring thermal resistance of two-terminal networks consists in that tested two-terminal network with trimming resistor connected in series is connected in parallel to reference two-terminal network with known thermal resistance RT1 and with second trimming resistor connected in series. Short pulses of current of large relative pulse duration and fixed amplitude I0 are fed. Resistance of trimming resistors is set such that equality of pulse powers dissipated by tested and reference two-terminal networks is realized and then constant heating current with value equal to amplitude of short pulses of current is supplied. Rated resistance of trimming resistors is chosen same and exceeding by factor of 102 rated active resistance of given type of two-terminal networks. Upon leveling of pulse powers but before supply of constant heating current amplitudes of voltages are measured across reference U10 and tested U20 two-terminal networks. After supply of constant heating current voltage is measured across reference U1 and tested U2 two-terminal networks under steady state and value of thermal resistance RT2 of tested two-terminal network is found by formula where ΔU1 = U1-U10 and RT1 is thermal resistance of reference two-terminal network. EFFECT: widened class of tested two-terminal networks, possibility to obtain measurement result in the form of direct reading of measured value in chosen system of units. 3 dwg

Similar patents RU2206900C1

Title Year Author Number
PROCESS MEASURING THERMAL RESISTANCE OF TWO-TERMINAL NETWORKS WITH KNOWN POSITIVE TEMPERATURE COEFFICIENT OF CURRENT 2000
  • Sergeev V.A.
RU2166764C1
METHOD MEASURING THERMAL RESISTANCE OF TWO-TERMINAL NETWORKS WITH WELL-KNOWN TEMPERATURE COEFFICIENT OF RESISTANCE 2000
  • Sergeev V.A.
  • Vasil'Ev A.N.
RU2167429C1
PROCESS DETERMINING THERMAL RESISTANCE OF JUNCTION-PACKAGE OF SEMICONDUCTOR DIODES 2001
  • Sergeev V.A.
RU2178893C1
APPARATUS FOR MEASURING THERMAL PARAMETERS OF DOUBLE-TERMINAL NETWORKS BY COMPARISON METHOD 2002
  • Sergeev V.A.
RU2227922C2
DEVICE FOR MEASURING JUNCTION-TO-CASE THERMAL RESISTANCE OF SEMICONDUCTOR DIODES 1994
  • Sergeev V.A.
  • Judin V.V.
RU2087919C1
METHOD FOR PULSE-WIDTH OUTPUT VOLTAGE REGULATION OF SUPPLY MAINS CONVERTER 1996
  • Sidorov S.N.
  • Shikin Ju.L.
RU2110136C1
METHOD FOR MEASURING SEPARATE PARAMETERS OF N- ELEMENT TWO-TERMINAL NETWORKS BY MEANS OF MULTIPLE-PORT TRANSFORMER BRIDGE 2000
  • Tjukavin A.A.
  • Tjukavin P.A.
  • Tjukavin A.A.
RU2174688C1
MULTIPLE-ARM ALTERNATING CURRENT TRANSFORMER BRIDGE FOR MEASURING PARAMETERS OF THREE-PIECE DIPOLES USING PARALLEL-SERIAL GLC CIRCUIT AND METHOD FOR ITS BALANCING USING THREE PARAMETERS 1999
  • Tjukavin A.A.
  • Khaziev T.A.
  • Dugushkin S.N.
  • Tjukavin P.A.
RU2149413C1
METHOD OF SEPARATE MEASUREMENT OF PARAMETERS OF N-ELEMENT TWO-TERMINAL NETWORKS BY MULTIARM TRANSFORMER BRIDGE 2000
  • Tjukavin A.A.
  • Tjukavin P.A.
  • Tjukavin A.A.
RU2168181C1
DEVICE MEASURING THERMAL RESISTANCE OF TRANSISTORS 2000
  • Sergeev V.A.
RU2185634C1

RU 2 206 900 C1

Authors

Sergeev V.A.

Dates

2003-06-20Published

2002-02-15Filed