DEVICE FOR MEASURING JUNCTION-TO-CASE THERMAL RESISTANCE OF SEMICONDUCTOR DIODES Russian patent published in 1997 - IPC

Abstract RU 2087919 C1

FIELD: semiconductor engineering. SUBSTANCE: device has initial current supply, heating current supplies, control-pulse generator, inverting amplifier-limiter, first detector of temperature-sensing parameter voltage, second detector of diode heating current and voltage, selective voltmeter, electronic switch, first diode heating current and voltage measuring mode switch, second switch for measuring voltage of temperature-sensing parameter and heating power components, low-value current-connecting resistor, and isolating capacitor. EFFECT: reduced hardware cost for measuring thermal resistance. 1 dwg

Similar patents RU2087919C1

Title	Year	Author	Number
PROCESS DETERMINING THERMAL RESISTANCE OF JUNCTION-PACKAGE OF SEMICONDUCTOR DIODES	2001	Sergeev V.A.	RU2178893C1
DEVICE FOR DETERMINING THERMAL JUNCTION-TO-CASE RESISTANCE OF LOGIC INTEGRATED MICROCIRCUITS	2007	Judin Viktor Vasil'Evich Sergeev Vjacheslav Andreevich	RU2327178C1
METHOD FOR DETERMINATION OF HEAT-TRANSFER RESISTANCE FOR DIGITAL CMOS INTEGRATED CIRCUITS	2012	Sergeev Vjacheslav Andreevich Panov Evgenij Anatol'Evich Urlapov Oleg Vladimirovich Judin Viktor Vasil'Evich	RU2504793C1
PROCESS MEASURING THERMAL RESISTANCE OF TWO-TERMINAL NETWORKS WITH KNOWN POSITIVE TEMPERATURE COEFFICIENT OF CURRENT	2000	Sergeev V.A.	RU2166764C1
METHOD MEASURING THERMAL RESISTANCE OF TWO-TERMINAL NETWORKS WITH WELL-KNOWN TEMPERATURE COEFFICIENT OF RESISTANCE	2000	Sergeev V.A. Vasil'Ev A.N.	RU2167429C1
TECHNIQUE MEASURING THERMAL RESISTANCE OF TWO-TERMINAL NETWORKS	2002	Sergeev V.A.	RU2206900C1
METHOD MEASURING HEAT RESISTANCE OF JUNCTION-PACKAGE OF DIGITAL INTEGRATED MICROCIRCUITS	2000	Sergeev V.A.	RU2172493C1
METHOD FOR DETERMINING THERMAL IMPEDANCE OF CMOS DIGITAL INTEGRATED MICROCIRCUITS	2011	Sergeev Vjacheslav Andreevich Lamzin Vladimir Aleksandrovich Judin Viktor Vasil'Evich	RU2463618C1
DEVICE FOR MEASURING TRANSITION-BODY HEAT RESISTANCE OF DIGITAL INTEGRAL MICROCIRCUITS	2000	Sergeev V.A.	RU2174692C1
METHOD FOR DETERMINING THERMAL RESISTANCE OF DIGITAL INTEGRATED MICROCIRCUITS	2007	Judin Viktor Vasil'Evich Sergeev Vjacheslav Andreevich	RU2327177C1

RU 2 087 919 C1

Authors

Sergeev V.A.

Judin V.V.

Dates

1997-08-20—Published

1994-08-15—Filed