DEVICE MEASURING POLARIZATION MATRIX OF SCATTERING OF OBJECT Russian patent published in 2002 - IPC

FIELD: radiolocation, radio navigation. SUBSTANCE: device can be employed to measure characteristics of scattering of electromagnetic waves by object, to detect object, to evaluate its coordinates and to identify it. Device measuring polarization matrix of scattering of object has double channel polarization antenna, two reception-transmission switches, channel commutator, transmitter, former of orthogonal signals, master generator, synchronizer, heterodyne, two mixers, four matched filters, four quadrature phase detectors and analog- to-digital converter. First output of synchronizer is connected to first inputs of former of orthogonal signals, transmitter and channel commutator, first output of heterodyne is connected to second input of transmitter, output of former of orthogonal signals is connected to third input of transmitter, output of master generator is connected to second input of former of orthogonal signals, output of transmitter is connected to input of channel commutator whose outputs are connected through proper reception-transmission switch to first and second input of double channel polarization antenna correspondingly. Second outputs of reception-transmission switches are connected to first inputs of first and second mixers. Second output of heterodyne is connected to second inputs of mixers, output of first mixer is connected through first and third matched filters to second inputs of first and second quadrature phase detectors correspondingly. Output of second mixer is connected through second and fourth matched filters to second inputs of third and fourth quadrature phase detectors correspondingly. Master generator is connected to first inputs of all quadrature phase detectors, outputs of all quadrature phase detectors and second output of synchronizer are connected to proper inputs of analog-to-digital converter which outputs are outputs of device. EFFECT: increased precision of measurement of polarization matrix of scattering of object thanks to shortened measurement time and consequently reduced methodological measurement error. 1 dwg