METHOD FOR MEASURING THE COMPLEX PERMITTIVITY OF A MATERIAL IN THE MICROWAVE RANGE Russian patent published in 2023 - IPC G01R27/26 G01N22/00 

FIELD: microwave measurements.

SUBSTANCE: invention relates to the field of radio measurements of the parameters of dielectric materials in the microwave, including the relative dielectric permittivity and the tangent of the dielectric loss angle. A method for measuring the complex permittivity of a material in the microwave range includes placing a sample of the material under study in a microwave device, measuring the frequency dependence of the reflection coefficient and/or transmission coefficient of the microwave device with the image located in it and processing the measurement results, in which the values of the complex permittivity of the sample are selected in the electrodynamic simulation environment so that the calculated frequency dependences of the reflection coefficient and/or transmission coefficient differ minimally from the measured dependences. In addition, the frequency dependence of the transmission coefficient of the microwave device without a sample from the test material located in it and/or the transmission coefficient of the microwave device with a sample of a material with a known complex dielectric permittivity is additionally measured and calculated in the electrodynamic simulation environment. The proximity of the results of measurements and calculations is used to judge the acceptability of the electrodynamic modelling environment used and the correctness of the description of the microwave device in it.

EFFECT: expanding the scope of the method both in relation to the use of microwave devices of various configurations, and in relation to the shape, size and parameters of the measured sample.

1 cl, 1 dwg