FIELD: optoelectronics, holography, interferometry, Fourier spectroscopy. SUBSTANCE: given photoelectronic device is intended for electron measurement of spatial- time distribution of amplitudes and phases of opposite light waves. Technical result of invention consists in measurement of total intensity of luminous fluxes propagating in opposite directions without noticeable attenuation and distortion of wave fronts of these luminous fluxes, in generation of signal characterizing amplitude and phase distribution of interference field in space and its time dynamics. Proposed photoelectronic device has sealed cylinder, flat window with photocathode applied to inner side letting radiation transit and having optical thickness under λmin/2, anode, feeding electrodes connected to anode and cathode. Novelty of invention lies is presence of second window located opposite to first window and in fabrication of all elements in path of measured optical radiation transmitting this radiation. λmin is wavelength of short-wave boundary of spectral range of photoelectronic device. EFFECT: capability for electronic measurement of total intensity of luminous fluxes propagating in opposite directions. 1 dwg
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Authors
Dates
2004-04-20—Published
2002-02-13—Filed