PROCEDURE FOR MEASURING PLOTTENESS OF SHEET MATERIAL Russian patent published in 2004 - IPC

Abstract RU 2230291 C2

FIELD: measurement technology. SUBSTANCE: procedure for measuring plotteness of sheet material presents measurement of width of distribution of light projection on surface of sheet material in the form of concentric rings placed one inside another, obtained by means of two light sources as minimum and displaced one relative another in vertical direction. Plotteness of sheet material is established as difference in heights of individual sections of sheet material found by following expression Hi = L1-L0(X0i/X1i-1), where L0 is distance from reference plane to light source 1, mm; L1 is distance from reference plane to light source 2, mm; X0i is width of i-th projection of ray on surface of sheet material from light source 1, pixels; X1i is width of i-th projection of ray on surface of sheet material from light source 2, pixels; i is number of individual projection of ray on surface of sheet material. EFFECT: enhanced accuracy and reliability of measurement of sheet material, raised quality of products. 3 dwg

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RU 2 230 291 C2

Authors

Gorkovenko P.I.

Zuev A.N.

Shapiro D.L.

Zakharchenko A.Ju.

Shachneva S.E.

Rosljakov E.N.

Medvedev D.D.

Dates

2004-06-10Published

2002-07-22Filed