METHOD OF DIFFERENTIAL MEASUREMENT OF DEVIATION FROM ROUNDNESS Russian patent published in 2004 - IPC

Abstract RU 2239785 C2

FIELD: measuring engineering.

SUBSTANCE: method includes measuring eccentricity and initial phase of the first order harmonic of the Fourier series, making the coordinate system corresponding to the minimum methodical error, and determining the deviation from roundness in this coordinate system.

EFFECT: enhanced accuracy of measurements.

cl, dwg

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RU 2 239 785 C2

Authors

Zakharov O.V.

Kochetkov A.V.

Sysuev D.A.

Dates

2004-11-10—Published

2002-11-11—Filed