FIELD: flaw detection technologies.
SUBSTANCE: method includes mounting standard imitator with standard flaws of different width but same depth matching given possible size of flaw in direction of x-raying, curve of distribution ΔD/γD=f(b) is built on basis of photometric data of standard flaws images, where ΔD - contrast of flaw images, γD contrast coefficient of radiographic film in area of flaw image, b - width of standard flaw and then by use of given curve sizes of real flaws are estimated.
EFFECT: lower laboriousness, higher reliability and precision.
1 dwg
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