FIELD: measurement of low resistances.
SUBSTANCE: prior to starting measurements temperature control unit transfers signal indicating that working temperature is attained in central processor unit. Then current generator unit produces first desired current in measuring circuit. Central processor unit selects gain of reference and measuring channels at steady state current in compliance with measurement range and sends instruction to measuring channel amplifier unit to measure amplifier zero offset. After that digital-to-analog converter reduces reference voltage, and amplifier gain is adjusted. Then amplifier zero offset is measured in reference channel whereupon instruction is conveyed to measuring unit amplifier unit for measuring voltage at known resistance.
EFFECT: enhanced reliability, measurement accuracy, and speed, extended measurement range.
23 cl, 4 dwg
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