FIELD: measuring engineering.
SUBSTANCE: method comprises probing the dielectric coating by the electromagnetic signal from the emitter made of a mirror aerial and receiving the reflected signal with the use of a receiver made of a mirror aerial. The emitter and receiver are arranged in the same plane at the same distance from the coating to be measured. The strength of the electric field of the wave reflected form the surface is measured. The thickness of the coating is determined from the formula δ = ErefR - k(30PG)1/2/Eref, where R is the distance from the emitter to the surface of the dielectric substrate, k is the reflecting coefficient from the dielectric coating, P is the emitter power, and G is the directness of the emitter .
EFFECT: expanded functional capabilities.
1 dwg
Title | Year | Author | Number |
---|---|---|---|
APPARATUS FOR MEASURING THICKNESS OF DIELECTRIC COATING | 2009 |
|
RU2413180C1 |
METHOD OF DETERMINING THICKNESS OF METAL COATING | 2010 |
|
RU2452938C1 |
METHOD FOR DETECTION OF DIELECTRIC COAT THICKNESS | 2007 |
|
RU2350899C1 |
METHOD OF DETERMINING THE DEGREE OF DISCHARGE OF CHEMICAL CURRENT SOURCE | 0 |
|
SU1003210A1 |
METHOD FOR DETERMINING THICKNESS OF DIELECTRIC MATERIAL | 2003 |
|
RU2240504C1 |
METHOD TO DETECT DIAMETER OF DIELECTRIC HOLLOW CYLINDRICAL ITEM | 2013 |
|
RU2544893C2 |
MICROWAVE METHOD OF DETECTING AND EVALUATING NON-UNIFORMITIES IN DIELECTRIC COATINGS ON METAL | 2012 |
|
RU2507506C2 |
MICROWAVE METHOD AND DEVICE FOR MEASURING ELECTROMAGNETIC PARAMETERS OF DIELECTRIC AND MAGNETIC-DIELECTRIC COATINGS APPLIED ONTO METAL | 2003 |
|
RU2273839C2 |
METHOD FOR RADAR-LOCATION DETERMINATION OF ICE THICKNESS | 2013 |
|
RU2526222C1 |
METHOD FOR DETECTION OF DIELECTRIC COAT THICKNESS | 2007 |
|
RU2350901C1 |
Authors
Dates
2005-10-20—Published
2004-05-31—Filed