METHOD OF MEASURING THICKNESS OF DIELECTRIC COATING Russian patent published in 2005 - IPC

Abstract RU 2262658 C1

FIELD: measuring engineering.

SUBSTANCE: method comprises probing the dielectric coating by the electromagnetic signal from the emitter made of a mirror aerial and receiving the reflected signal with the use of a receiver made of a mirror aerial. The emitter and receiver are arranged in the same plane at the same distance from the coating to be measured. The strength of the electric field of the wave reflected form the surface is measured. The thickness of the coating is determined from the formula δ = ErefR - k(30PG)1/2/Eref, where R is the distance from the emitter to the surface of the dielectric substrate, k is the reflecting coefficient from the dielectric coating, P is the emitter power, and G is the directness of the emitter .

EFFECT: expanded functional capabilities.

1 dwg

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RU 2 262 658 C1

Authors

Akhobadze G.N.

Dates

2005-10-20Published

2004-05-31Filed