FIELD: analytical instrument engineering.
SUBSTANCE: method of producing calibration models for different measurement devices which allow determining one or a number of secondary properties of unknown specimen from results of measurement of variety of primary properties of the specimen. Method is based on choosing of calibration set of specimens with known secondary properties and on measuring of primary properties of any specimen of calibration set onto reference device. According to the method, results of measurement of primary properties of specimens of calibration device onto reference device are transformed by means of calibration transfer relations to the form being equivalent to results of measurement of specimen of calibration device onto device to be calibrated. Then results of measurement of primary properties of specimens of calibration device transformed to form being equivalent to results of measurement at reference device are compared with known secondary properties of the same specimens and independent multidimensional calibration model is produced by means of regressive analysis which model expresses secondary properties of specimen in terms of primary properties measured at device to be calibrated. Mathematical relations of calibration transfer are determined by selecting set of specimen for transferring calibrations due to measurement of primary properties of any specimen of set for transferring calibrations at reference and calibrated devices. Results of measurement of primary properties of specimens of set for transferring calibrations are compared by means of multidimensional regressive analysis with results of measurement of primary properties of the same specimens received at device to be calibrated. Independent multidimensional calibration model is chosen by using quantitative parameters of calibration validation. Method provides high precision of prediction of unknown specimen's properties as well as high precision of determination of properties to be analyzed. Method also takes non-linear differences of technical parameters of calibrated and reference devices into account as well as influence of working conditions onto those properties.
EFFECT: improved precision.
12 cl, 1 dwg, 2 tbl
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Authors
Dates
2005-12-20—Published
2004-07-27—Filed