METHOD FOR X-RAY FLUORESCENCE DETERMINATION OF CONTENT OF IMPURITIES OF STRUCTURAL MATERIALS Russian patent published in 2016 - IPC G01N23/223 

FIELD: measuring equipment.

SUBSTANCE: invention consists in the fact that the X-ray fluorescence determination of the content of impurities of structural materials comprises measuring of intensities of analytical lines of controlled impurities in the group of samples of this material, additionally measures the intensity of analytical lines of impurities in the samples of standard reference material containing the same contaminants, results of these measurements, build calibration curves of the intensity of analytical lines of elements with an additional measurement is carried out with review of the spectrum of the investigated structural material and defining main structural element of the investigated filler material, additionally measuring the intensity of analytical lines of the elements controlled by impurities in the samples consisting that element, absorption factors and the slopes of calibration curves calculated for samples consisting of the average value of the content element in the reference calibration of test samples and the filler material of construction, then get the true content of impurities in the test structural material by multiplying the ratio of the conditional content slopes calibration curves in the reference and test materials on the relevant mathematical formulas.

EFFECT: enabling high-precision of X-ray fluorescence determination of impurities in a variety of materials.

1 cl, 1 dwg, 1 tbl