X-RAY FLUORESCENT ANALYSIS METHOD WITH CALIBRATION BY THE ONE-ELEMENT SAMPLES Russian patent published in 2019 - IPC G01N23/223 

FIELD: measurement technology.

SUBSTANCE: using: for the element in the known test material content determining. Essence of invention is that performing the analytical lines measurement in the available reference material standard samples containing the same element as in the test material, by these measurements results building the calibration graphs of the elements analytical lines intensity dependency on the content and using the calibration graphs slopes calculated ratio for the element to be determined analytical line in the reference and known test material, obtaining the being determined element content, at that, preliminarily measuring the element being determined analytical line I_i0 intensity in the single element sample (C_i=100 %) with the X-ray tube anode current strength, which provides the intensity on the current strength linear dependence, under the same conditions, measuring the element being monitored is I_i analytical line intensity in the known test material, according to the given mathematical expression calculating the absorption parameter P_i, on which basis the of the controlled element C_i (%) content in the known test material is determined.

EFFECT: enabling the possibility of the used X-ray spectral equipment simplification, as well as reduction of the analysis time and its simplification.

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