METHOD FOR ESTIMATION AND INCREASE OF METROLOGICAL RELIABILITY OF MEASURING DEVICES WITH CONSIDERATION OF TEMPERATURE MODE OF THEIR OPERATION Russian patent published in 2006 - IPC G01R31/30 

FIELD: measuring equipment engineering, possible use for estimating and increasing metrological reliability of electronic measuring means with consideration of their operation temperature.

SUBSTANCE: in accordance to method, for each analog block of electronic measuring device primarily a metrological resource is determined by modeling state of metrological characteristic of analog block with utilization of information about temporal alternation of parameters of included elements. To increase metrological resource by value of normalized partial derivative of metrological characteristic function, considering possible distribution of radio elements parameters, elements are selected, causing dominating effect on values of metrological characteristic. On basis of condition of largest compensation of total effect of time-temperature aging functions of radio element parameters on change of values of metrological characteristic of block, searching of variants of replacement of one or several elements by analogical ones present with different time-temperature stability characteristics, is performed. When improved value of metrological resource is achieved, aforementioned elements in block are replaced.

EFFECT: increased efficiency.

4 dwg