FIELD: high-voltage engineering; electrical insulation and vacuum discharges.
SUBSTANCE: proposed method that can be used in electronic industry to increase electric strength of vacuum insulation of high-voltage electronic and photoelectronic devices and structures includes aging of vacuum gap by single high-voltage pulses of shorter length compared with that of operating voltage, polarity corresponding to that of operating voltage at amplitudes maintaining breakdown delay time equal to conditioning pulse length. Upon termination of aging electrode gap is minimized, pulse aging is resumed, and gap is enlarged to original value.
EFFECT: enhanced effectiveness of method due to increasing electric field strength at optimal aging conditions of high-voltage electronic devices and structures.
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