FIELD: roentgen optics; roentgen ray flux reflecting, focusing, and monochromatization.
SUBSTANCE: proposed method for controlling X-ray flux by means of controlled energy actions on control unit incorporating diffraction medium and substrate includes change of substrate and diffraction medium surface geometry and diffractive parameters of this medium by simultaneous action on control-unit substrate and on outer surface of control-unit diffraction medium with heterogeneous energy. X-ray flux control system has X-ray source and control unit incorporating diffraction medium and substrate; in addition, it is provided with diffraction beam angular shift corrector connected to recording chamber; control unit is provided with temperature controller and positioner; substrate has alternating members controlling its geometric parameters which are functionally coupled with physical parameters of members, their geometric parameters, and amount of energy acting upon them. Diffraction medium can be made in the form of crystalline or multilayer periodic structure covered with energy-absorbing coating.
EFFECT: enhanced efficiency of roentgen-ray flux control due to dynamic correction of focal spot shape and size.
3 cl, 1 dwg
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