INTENSITY MODULATION OF X-RAY BEAM Russian patent published in 2018 - IPC G01K1/06 

FIELD: electricity.

SUBSTANCE: intensity modulation of the X-ray beam is carried out by changing the reflection conditions of X-ray reflection from a piezoelectric single crystal under the conditions of applying an electric field to it. The said change of conditions of X-ray reflection is made by changing the piezo deformation of said single crystal, resulting in a homogeneous change of interplain distance in crystal lattice of mentioned single crystal, accompanied by an angular offset of its diffraction reflection curve (DRC), under the influence of constant electric field, intensity E of which is change depending on the magnitude of the reflected X-rays (Iθ) according to a specified formula.

EFFECT: enabling optimal intensity modulation of the X-ray beam in the Bragg X-ray reflection mode from the piezoelectric single crystal with a small half-width of the original diffraction reflection curve in conditions of applying constant electric field to it.

2 cl, 2 tbl, 2 dwg