DIFFRACTOMETER Russian patent published in 2018 - IPC G21K1/06 

FIELD: measuring equipment.

SUBSTANCE: invention relates to devices for X-ray diffraction studies of materials. Diffractometer contains an X-ray source, followed by a first slit diaphragm in succession along the X-ray path, the first goniometer, the second slit diaphragm, the second goniometer, and also the radiation detector, in addition comprises a separate detachable unit. This unit has an electromechanical X-ray optical element based on a silicon crystal connected to a anhysteretical monolithic bimorph. Detachable unit is connected to the voltage modulation unit on the named element and, depending on the task of the research, can be placed both on the first goniometer along the x-ray path and on the second goniometer. In this case, the second goniometer is additionally equipped with a unit for mounting the test sample, which allows an additional adjustment of the position of the test sample relative to the radiation beam, and also adjustment by adjusting inclination angles and azimuth angle. Radiation detector and the second goniometer are electrically connected to the control unit. As anhysteretical monolithic bimorph of an electromechanical X-ray optical element, a bi-domain lithium niobate crystal can be used, the connection of a silicon crystal with anhysteretical monolithic bimorph can be carried out by gluing.

EFFECT: creation of a device in which the electronically controlled reconstruction of the angular position of the X-ray monochromator is realized, which provides an operative and precise analysis of the objects under study.

3 cl, 6 dwg