METHOD AND APPARATUS FOR RECORDING DIFFRACTION REFLECTION CURVES Russian patent published in 2015 - IPC G01N23/20 

FIELD: physics.

SUBSTANCE: X-ray beam of a given range from an X-ray source is transmitted through two diaphragms, and intensity of X-rays subjected to diffraction in the analysed crystal is determined by a detector with successive variation of parameters of conditions of the captured X-ray reflection, wherein parameters of diffraction conditions are varied by modulating the interplanar distance of the captured X-ray reflection using ultrasonic radiation generated by an electro-acoustic resonator. The analysed crystal is placed behind the first diaphragm on the X-ray path; diffraction conditions are scanned by modulating the interplanar distance in the crystal analyser, which is acoustically coupled to the electro-acoustic resonator, wherein the analysed crystal is placed in a Bragg diffraction position of the selected reflection, and parameters of diffraction conditions are scanned by a detector connected to a standing wave detection unit, to which a clock pulse is transmitted from a generator, which is used to excite ultrasonic vibrations in the electro-acoustic resonator.

EFFECT: recording diffraction reflection curves by controlling parameters of an X-ray beam using ultrasound, without the need for sample preparation and without limits on the size of the sample.

8 cl, 2 dwg