CELL FOR MEASUREMENT OF DIELECTRIC PARAMETERS OF THIN FILMS OF COMPLEX OXIDES Russian patent published in 2006 - IPC G01R27/26 

Abstract RU 2282203 C1

FIELD: measurement of dielectric parameters of thin films of complex oxides used in manufacture of lithium - ion cells.

SUBSTANCE: a film pattern of electrodes of nickel, copper or aluminum in the form of comb-like electrodes is applied onto the supporting structure of glass ceramic or polycor through a mask by vacuum spraying. A film of complex oxide is applied onto the surface of the contours. The electrodes are made of metal applied on the supporting structure in the form of comb-like contours with the combs directed toward one another, inserted one in the other and coated by a thin film 0.3 - to 0.9μm thick.

EFFECT: enhanced precision of measurement, provided multiple use of cells.

3 ex, 3 tbl, 2 dwg

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RU 2 282 203 C1

Authors

Sukhova Galina Ivanovna

Patrusheva Tamara Nikolaevna

Chudinov Evgenij Alekseevich

Men'Shikov Viktor Vasil'Evich

Patrushev Valerij Vasil'Evich

Dates

2006-08-20Published

2005-04-08Filed