METHOD OF MEASURING PARAMETERS OF SPECTRAL LINES IN SPECTRAL ANALYSIS Russian patent published in 2007 - IPC G01J3/30 G01N21/00 

Abstract RU 2291406 C2

FIELD: measuring technique.

SUBSTANCE: method comprises representing the spectra of a standard and a sample with basis functions at the same points of discretization and representing the parameters of spectral lines by a correlation analysis of the function. The basis functions represent a wavelet function.

EFFECT: enhanced accuracy of measurements.

9 dwg

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RU 2 291 406 C2

Authors

Kuznetsov Andrej Al'Bertovich

Pimshin Dmitrij Aleksandrovich

Odinets Aleksandr Il'Ich

Dates

2007-01-10Published

2005-04-05Filed