METHOD AND DEVICE FOR SPECTRAL ANALYZING OF MATERIAL ELEMENT COMPOSITION Russian patent published in 1994 - IPC

Abstract RU 2007703 C1

FIELD: test equipment. SUBSTANCE: additional elements are brought when exciting laser plasma in tested material by means of focusing laser radiation onto tested object, after that subsequent registration of emission spectrum is carried out. These element provide to achieve optimal characteristics as when focusing laser beam and when registering spectrum. Device also has pulse generator and gate generator. EFFECT: improved precision of method. 6 dwg

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RU 2 007 703 C1

Authors

Vlasov D.V.

Prokhorov A.M.

Tsipenjuk D.Ju.

Dates

1994-02-15—Published

1991-06-14—Filed