METHOD FOR ESTIMATING HARD PALATE HEIGHT Russian patent published in 2007 - IPC A61B5/107 

FIELD: medicine.

SUBSTANCE: method involves taking imprint from the maxilla. Control diagnostic plaster model is manufactured. Real height of patient hard palate is measured as perpendicular height drawn from the deepest palatine vault point to the line connecting interdental papillae tops between the second and the first premolars. Optimum value of individual hard palate height is measured. Naso-maxillary complex height is measured for this purpose as distance from nasion point to the point of intersection of Dreyfus line with occlusion plane. The obtained value is substituted into formula H=(r_n-OcP)/k, where H is the optimum value of individual hard palate height, r_n-OcP is the distance from nasion point to the point of intersection of Dreyfus line with occlusion plane of patient. K=4 is the coefficient of the optimum value of individual hard palate height. The calculated value is compared to the real one for determining difference used as anomaly expression degree criterion to draw conclusions whether norm or marked anomaly takes place.

EFFECT: high accuracy in estimating orthodontic disorder degree.

3 dwg, 1 tbl