METHOD OF DETERMINING MASS FRACTIONS OF COMPONENTS IN MATERIALS AND ALLOYS Russian patent published in 2008 - IPC G01N21/00 

FIELD: spectral analysis.

SUBSTANCE: method comprises exciting specimen radiation in the low-temperature plasma, recording spectrum of specimen radiation, measuring intensity of analytic line of the element and comparison line, calculation of the concentration of the element in the sample from the physical model that includes terms for parameters characterizing the stable state of the low-temperature plasma in the standard specimen with respect to the sample and capability of the specimen to emit the low-temperature plasma with respect to the standard specimen for each element.

EFFECT: enhanced precision.

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